Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits

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TN 47

ZHANG Min-Xuan, SUN Yan, SONG Chao. Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits [J]. Journal of Shanghai Jiaotong University, 2013, 47(01): 1-6.

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Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits

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