High Curvature Stripe Profile Extraction Algorithm of Line Structured Light Measuring System

doi:10.1007/s12204-022-2414-9

Abstract

Abstract: Non-uniformity of light sources is one of the inevitable error factors causing poor shape recovery accuracy of photometric stereo methods under close-range lighting with quasi point lights. Semi-calibrated photometric stereo methods are required to avoid repeated, tedious and impractical photometric calibration. In this paper, two simple, concise but effective mesh-based semi-calibrated photometric stereo methods are proposed. The proposed methods extend the traditional mesh-based photometric stereo methods and further allow joint and accurate estimation of normals and non-uniform light intensities by alternatively updating normals, depth maps and intensities. Extensive experiments are conducted to validate the effectiveness and robustness of the proposed algorithms. Even under extremely severe non-uniform lighting, the proposed methods can still suppress the error and improve the shape recovery accuracy by up to 65.6% in real-world experiments.

Key words: photometric stereo, mesh deformation, non-uniform light sources, shape recovery

摘要： 在近似点光源的近距离照明条件下，光源的非均匀性是导致光度立体法形貌恢复精度不佳的不可避免的误差因素之一。为了避免对光源进行重复、繁琐的光度校准，需要半校准的光度立体法。本文提出了两种简单有效的基于栅格的半校准光度立体算法。所提出的方法扩展了传统的基于栅格的光度立体法，通过交替迭代地更新法向量、深度图和光源强度，可同时进行法向量和非均匀的光源强度的联合准确估计。本文进行了大量实验证明所提出算法的有效性和鲁棒性。实验表明，即使在极其严重的非均匀照明下，所提出的方法仍然可以有效地抑制误差，以及在实际实验中将形貌恢复精度提高达65.6%。

关键词: 光度立体, 栅格变形, 非均一光源, 形貌重建

CLC Number:

TP301

CHEN Qiheng1(陈启恒),PENG Na2(彭娜)，Lü Na1(吕娜)，TAO Wei(陶卫)，ZHAO Huil*(赵辉). High Curvature Stripe Profile Extraction Algorithm of Line Structured Light Measuring System[J]. J Shanghai Jiaotong Univ Sci, 2023, 28(5): 577-586.

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