Journal of shanghai Jiaotong University (Science) ›› 2015, Vol. 20 ›› Issue (4): 472-476.doi: 10.1007/s12204-015-1652-5
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SUN Bo1* (孙 博), YE Tian-yuan1 (叶田园), FANG Yuan2 (方 园)
Online:
2015-08-29
Published:
2015-08-05
Contact:
SUN Bo (孙 博)
E-mail:sunbo@buaa.edu.cn
CLC Number:
SUN Bo1* (孙 博), YE Tian-yuan1 (叶田园), FANG Yuan2 (方 园). A Novel Model of Failure Rate Prediction for Circular Electrical Connectors[J]. Journal of shanghai Jiaotong University (Science), 2015, 20(4): 472-476.
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