Journal of Shanghai Jiao Tong University ›› 2017, Vol. 51 ›› Issue (7): 886-891.
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DU Dangboa,HU Changhuaa,SI Xiaoshenga,ZHANG Zhengxina,ZHANG Weib
Published:
2017-07-31
Supported by:
[1]HU C H, ZHOU Z J, ZHANG J X, et al. A survey on life prediction of equipment[J]. Chinese Journal of Aeronautics, 2015, 28(1):2533. [2]SI X S, WANG W, HU C H, et al. Remaining useful life estimation—A review on the statistical data driven approaches[J]. European Journal of Operational Research, 2011, 213(1):114. [3]YE Z S, XIE M. Stochastic modelling and analysis of degradation for highly reliable products[J]. Applied Stochastic Models in Business & Industry, 2014, 31(1):1632. [4]EKER O F, CAMCI F, GUCLU A, et al. A simple statebased prognostic model for railway turnout systems[J]. IEEE Transactions on Industrial Electronics, 2011, 58(5): 17181726. [5]GEBRAEEL N Z, LAWLEY M A, LI R, et al. Residuallife distributions from component degradation signals: A Bayesian approach[J]. IIE Transactions, 2005, 37(6): 543557. [6]SI X S, WANG W, HU C H, et al. A Wienerprocessbased degradation model with a recursive filter algorithm for remaining useful life estimation[J]. Mechanical Systems and Signal Processing, 2013, 35(1): 219237. [7]SI X S, WANG W, HU C H, et al. Remaining useful life estimation based on a nonlinear diffusion degradation process[J]. IEEE Transactions on Reliability, 2012, 61(1): 5067. [8]SI X S. An adaptive prognostic approach via nonlinear degradation modelling: Application to battery data[J]. IEEE Transactions on Industrial Electronics, 2015, 62(8):11. [9]SI X S, HU C H, KONG X Y, et al. A residual storage life prediction approach for systems with operation state switches[J]. IEEE Transactions on Industrial Electronics, 2014, 61(11): 63046315. [10]BIAN L, GEBRAEEL N. Computing and updating the firstpassage time distribution for randomly evolving degradation signals[J]. IIE Transactions, 2012, 44(11): 974987. [11]YE Z S, TANG L C, XU H Y. A distributionbased systems reliability model under extreme shocks and natural degradation[J]. IEEE Transactions on Reliability, 2011, 60(1): 246256. [12]LI J, FENG Q M, COIT D W. Modeling zoned shock effects on stochastic degradation in dependent failure processes[J]. IIE Transactions, 2015,47(5): 111. [13]PENG Y, DONG M. A prognosis method using agedependent hidden semi—Markov model for equipment health prediction[J]. Mechanical Systems and Signal Processing, 2011, 25(1): 237252. [14]WANG Z Q, HU C H, WANG W, et al. An additive Wiener processbased prognostic model for hybrid deteriorating systems[J]. IEEE Transactions on Reliability, 2014, 63(1): 208222. [15]SI X S, WANG W B, CHENG M Y, et al. A degradation pathdependent approach for remaining useful life estimation with an exact and closedform solution[J]. European Journal of Operational Research, 2013, 226(1): 5366. |
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