Journal of Shanghai Jiao Tong University ›› 2023, Vol. 57 ›› Issue (9): 1176-1185.doi: 10.16183/j.cnki.jsjtu.2022.299

Special Issue: 《上海交通大学学报》2023年“电子信息与电气工程”专题

• Electronic Information and Electrical Engineering • Previous Articles     Next Articles

Optical Feature Analysis and Diagnosis of Partial Discharge in C4F7N/CO2 Based on Multispectral Array

LI Ze1, QIAN Yong1(), ZANG Yiming1, ZHOU Xiaoli2, SHENG Gehao1, JIANG Xiuchen1   

  1. 1. Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
    2. Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai 200433, China
  • Received:2022-07-25 Revised:2022-09-25 Accepted:2022-11-23 Online:2023-09-28 Published:2023-09-27
  • Contact: QIAN Yong E-mail:qian_yong@sjtu.edu.cn

Abstract:

Optical detection of partial discharge (PD) is an important way to reflect the insulation status of equipment. C4F7N/CO2 gas mixture is one of the most potential substitutes for SF6 at present, but there is a lack of research on its optical PD characteristics and diagnostic methods. In this paper, a PD multispectral array detection platform that can collect 7 characteristic bands is constructed, and 4 kinds of PD defects are produced. The similarities and differences of the PD multispectral characteristics in phase distribution, energy distribution, and feature stacking map under the conditions of 5 different ratios of C4F7N/CO2 gas mixture and pure SF6 gas are analyzed. Finally, a novel method of PD diagnosis based on multispectral features (MF) and k-nearest neighbors (KNN) is proposed. The experimental results show that the fault recognition accuracy in pure SF6 can reach 96.2%. The recognition rate of C4F7N/CO2 gas mixture is above 88%, and the highest accuracy rate is 91.1%. This method has a guiding significance for the PD diagnosis of environmentally friendly gas-insulated equipment, and provides a new route for traditional PD detection and diagnosis.

Key words: C4F7N/CO2, partial discharge (PD), multispectral array, optical detection, pattern recognition

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