[1]Bose P, Albonesi D H, Marculescu D. Guest editors’ introduction: Power and complexity aware design [J]. IEEE Micro, 2003, 23 (5): 811.[2]王彬, 林争辉. 基于事务形式验证(TBFV)及8051的TBFV模型[J]. 上海交通大学学报, 2003, 37 (10): 15741577.WANG Bin, LIN Zhenghui. Transaction based formal verification (TBFV) and TBFV models for 8051 [J]. Journal of Shanghai Jiaotong University, 2003, 37 (10): 15741577.[3]Girard P, Landrault C, Pravossoudovitch S, et al. Comparison between random and pseudorandom generation for BIST of delay, stuckat and bridging faults [C]∥Proceedings of 6th IEEE International onLine Testing Workshop. Palma de Mallorca: IEEE, 2000: 121126.[4]Liang Z S, Yan X L, Wang J B, et al. A dynamic random instruction and stimulus generation for functional verification of embedded processor [C]∥Proceedings of 5th International Conference on ASIC. USA: IEEE, 2003: 459462.[5]Bartley M G, Galpin D, Blackmore T. A comparison of three verification techniques: Directed testing, pseudorandom testing and property checking [C]∥Proceedings of the 39th Design Automation Conference. New York, USA: ACM, 2002: 819823.[6]Mishra P, Dutt N. Specificationdriven directed test generation for validation of pipelined processors [J]. ACM Transactions on Design Automation of Electronic Systems, 2008, 13 (2): 136.[7]Qin X K, Mishra P. Automated generation of directed tests for transition coverage in Cache coherence protocols [C]∥Proceedings of 2012 Design, Automation and Test in Europe. Dresden: IEEE, 2012: 38.[8]Qin X K, Mishra P. Directed test generation for validation of multicore architectures [J]. ACM Transactions on Design Automation of Electronic Systems, 2012, 17 (3): 241265.[9]吴列治, 张盛兵, 沈绪榜. 基于动态伪随机技术的微处理器验证[J]. 计算机应用研究, 2008, 25 (6): 17041706.WU Liezhi, ZHANG Shengbing, SHEN Xubang. Verification of microprocessor based on dynamic pseudorandom instruction generation [J]. Application Research of Computers, 2008, 25 (6): 17041706.[10]沈海华, 王朋宇, 卫文丽, 等. 基于遗传算法的全芯片级覆盖率驱动随机验证技术[J]. 计算机研究与发展, 2009, 46 (10): 16121625.SHEN Haihua, WANG Pengyu, WEI Wenli, et al. A coverage directed test generation platform for microprocessors using genetic approach [J]. Journal of Computer Research and Development, 2009, 46 (10): 16121625.[11]孟庆东, 陈佳佳, 李兆麟. 基于带约束的随机平台接口IP核的功能验证[J]. 微处理机, 2010 (5): 1720.MENG Qingdong, CHEN Jiajia, LI Zhaolin. Function verification of interface IP core based on the restricted random testbench [J]. Microprocessors, 2010 (5): 1720.[12]张欣, 黄凯, 孟建熠, 等. 一种面向微处理器验证的分层随机激励方法[J]. 计算机应用研究, 2010, 27 (4): 12841288.ZHANG Xin,HUANG Kai,MENG Jianyi,et al. Multilayer random stimulus strategy for microprocessor verification [J]. Application Research of Computers, 2010, 27 (4): 12841288.[13]李拓, 王恩东, 胡雷均, 等. 一种Cache一致性协议验证中覆盖率驱动的随机验证方法[J]. 计算机应用与软件, 2011, 28 (11): 167170.LI Tuo, WANG Endong, HU Leijun, et al. Coverage driven random verification method in Cache coherence protocol verification [J]. Computer Applications and Software, 2011, 28 (11): 167170. |