上海交通大学学报(自然版) ›› 2013, Vol. 47 ›› Issue (01): 1-6.

• 无线电电子学、电信技术 •    下一篇

纳米级集成电路的软错误问题及其对策  

张民选,孙岩,宋超   

  1. (国防科学技术大学 计算机学院, 长沙 410073)
  • 收稿日期:2012-05-30 出版日期:2013-01-30 发布日期:2013-01-30
  • 基金资助:

    国家自然科学基金项目(60970036)

Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits  

 ZHANG  Min-Xuan, SUN  Yan, SONG  Chao   

  1. (College of Computer, National University of Defense Technology, Changsha 410073, China)
  • Received:2012-05-30 Online:2013-01-30 Published:2013-01-30

摘要: 介绍了纳米级集成电路中软错误的发生机制、发展趋势以及评估技术,概括了软件、电路和体系结构以及工艺器件级软错误的缓解对策,并针对软错误问题相关研究的发展提出几点建议.
   

关键词: 软错误, 集成电路, 可靠性

Abstract: This paper described the mechanism, trends and evaluation techniques of soft errors in nanometer scale integrated circuits. For solving the soft error problems, the paper summed up the countermeasures across the software level, circuit and architecturelevel as well as process devicelevel. At last,  some suggestions on the development of related studies on soft error problems were put
forward.  

Key words: soft error, integrated circuits, reliability

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