A Novel Model of Failure Rate Prediction for Circular Electrical Connectors
SUN Bo1* (孙 博), YE Tian-yuan1 (叶田园), FANG Yuan2 (方 园)
A Novel Model of Failure Rate Prediction for Circular Electrical Connectors
SUN Bo1* (孙 博), YE Tian-yuan1 (叶田园), FANG Yuan2 (方 园)
上海交通大学学报（英文版） . 2015, (4): 472 -476 .  DOI: 10.1007/s12204-015-1652-5