Journal of Shanghai Jiao Tong University ›› 2021, Vol. 55 ›› Issue (11): 1445-1452.doi: 10.16183/j.cnki.jsjtu.2021.017
Special Issue: 《上海交通大学学报》2021年12期专题汇总专辑; 《上海交通大学学报》2021年“材料科学”专题
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Received:
2021-01-18
Online:
2021-11-28
Published:
2021-12-03
Contact:
ZHANG Fuxi
E-mail:fx-zhang@shou.edu.cn
CLC Number:
WANG Zekun, ZHANG Fuxi. Modeling and Experimental Study of Tin Whiskers for 3D Electronic Packaging[J]. Journal of Shanghai Jiao Tong University, 2021, 55(11): 1445-1452.
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URL: https://xuebao.sjtu.edu.cn/EN/10.16183/j.cnki.jsjtu.2021.017
[1] | HERRING C, GALT J K. Elastic and plastic properties of very small metal specimens[J]. Physical Review, 1952, 85(6):1060-1061. |
[2] | 何小健, 王劲, 程剑, 等. 碰击开关锡晶须与引信弹道炸[J]. 探测与控制学报, 2011, 33(2):1-4. |
HE Xiaojian, WANG Jin, CHENG Jian, et al. Tin whisker on impact switch and fuze ballistic explosion[J]. Journal of Detection & Control, 2011, 33(2):1-4. | |
[3] | HAN S. Assessment of an electrical shorting and metal vapor arcing potential of tin whiskers[D]. Maryland, USA: University of Maryland, College Park: 2012. |
[4] | COUREY K J. An investigation of the electrical short circuit characteristics of tin whiskers[D]. Coral Gables, USA: University of Miami, 2008. |
[5] |
LINDBORG U. A model for the spontaneous growth of zinc, cadmium and tin whiskers[J]. Acta Metallurgica, 1976, 24(2):181-186.
doi: 10.1016/0001-6160(76)90021-3 URL |
[6] | HILLMAN D, WILCOXON R. Tin whisker risk assessment of a tin surface finished connector[J]. Surface Mount Technology, 2015, 30(2):68-79. |
[7] | 周颖. 基于硅通孔的三维电子封装热机械可靠性研究[D]. 武汉: 华中科技大学, 2016. |
ZHOU Ying. Research on reliability of through silicon via (TSV) in 3D integration[D]. Wuhan: Huazhong University of Science and Technology, 2016. | |
[8] |
AGLAN H A, PRAYAKARAO K R, RAHMAN M K, et al. Effect of environmental conditions on tin (Sn) whisker growth[J]. Engineering, 2015, 7(12):816-826.
doi: 10.4236/eng.2015.712071 URL |
[9] |
LIN S K, YORIKADO Y, JIANG J X, et al. Mechanical deformation-induced Sn whiskers growth on electroplated films in the advanced flexible electronic packaging[J]. Journal of Materials Research, 2007, 22(7):1975-1986.
doi: 10.1557/jmr.2007.0232 URL |
[10] |
TU K N, HSIAO H Y, CHEN C. Transition from flip chip solder joint to 3D IC microbump: Its effect on microstructure anisotropy[J]. Microelectronics Reliability, 2013, 53(1):2-6.
doi: 10.1016/j.microrel.2012.07.029 URL |
[11] |
KATO T, AKAHOSHI H, NAKAMURA M, et al. Correlation between whisker initiation and compressive stress in electrodeposited tin-copper coating on copper leadframes[J]. IEEE Transactions on Electronics Packaging Manufacturing, 2010, 33(3):165-176.
doi: 10.1109/TEPM.2010.2045384 URL |
[12] |
JIANG J X, LEE J E, KIM K S, et al. Oxidation behavior of Sn-Zn solders under high-temperature and high-humidity conditions[J]. Journal of Alloys and Compounds, 2008, 462(1/2):244-251.
doi: 10.1016/j.jallcom.2007.08.007 URL |
[13] |
BAATED A, KIM K S, SUGANUMA K, et al. Effects of reflow atmosphere and flux on Sn whisker growth of Sn-Ag-Cu solders[J]. Journal of Materials Science: Materials in Electronics, 2010, 21(10):1066-1075.
doi: 10.1007/s10854-010-0099-6 URL |
[14] |
XU C, ZHANG Y, FAN C L, et al. Driving force for the formation of Sn whiskers: Compressive stress-pathways for its generation and remedies for its elimination and minimization[J]. IEEE Transactions on Electronics Packaging Manufacturing, 2005, 28(1):31-35.
doi: 10.1109/TEPM.2005.846461 URL |
[15] |
LAL S, MOYER T D. Role of intrinsic stresses in the phenomena of tin whiskers in electrical connectors[J]. IEEE Transactions on Electronics Packaging Manufacturing, 2005, 28(1):63-74.
doi: 10.1109/TEPM.2005.846457 URL |
[16] |
VIANCO P T, REJENT J A. Dynamic recrystallization (DRX) as the mechanism for Sn whisker development. Part I: A model[J]. Journal of Electronic Materials, 2009, 38(9):1815-1825.
doi: 10.1007/s11664-009-0879-z URL |
[17] |
NIU C J, LEE H, CHEN S R, et al. High-energy lithium metal pouch cells with limited anode swelling and long stable cycles[J]. Nature Energy, 2019, 4(7):551-559.
doi: 10.1038/s41560-019-0390-6 URL |
[18] |
LIU Y S, LU C J, ZHANG P G, et al. Mechanisms behind the spontaneous growth of Tin whiskers on the Ti2SnC ceramics[J]. Acta Materialia, 2020, 185:433-440.
doi: 10.1016/j.actamat.2019.12.027 URL |
[19] |
CHEN W J, LEE Y L, WU T Y, et al. Effects of electrical current and external stress on the electromigration of intermetallic compounds between the flip-chip solder and copper substrate[J]. Journal of Electronic Materials, 2018, 47(1):35-48.
doi: 10.1007/s11664-017-5685-4 URL |
[20] |
HE Y, REN X, XU Y, et al. Origin of lithium whisker formation and growth under stress[J]. Nature Nanotechnology, 2019, 14(11):1042-1047.
doi: 10.1038/s41565-019-0558-z URL |
[21] |
JUNG D H, SHARMA A, JUNG J P. A review of soft errors and the low α-solder bumping process in 3D packaging technology[J]. Journal of Materials Science, 2018, 53(1):47-65.
doi: 10.1007/s10853-017-1421-y URL |
[22] |
MIZUGUCHI Y, MURAKAMI Y, TOMIYA S, et al. Effect of crystal orientation on mechanically induced Sn whiskers on Sn-Cu plating[J]. Journal of Electronic Materials, 2012, 41(7):1859-1867.
doi: 10.1007/s11664-012-1962-4 URL |
[23] |
VIANCO P T, NEILSEN M K, REJENT J A, et al. Validation of the dynamic recrystallization (DRX) mechanism for whisker and hillock growth on Sn thin films[J]. Journal of Electronic Materials, 2015, 44(10):4012-4034.
doi: 10.1007/s11664-015-3779-4 URL |
[24] |
CHO S, KO Y. Finite element analysis for reliability of solder joints materials in the embedded package[J]. Electronic Materials Letters, 2019, 15(3):287-296.
doi: 10.1007/s13391-019-00122-1 URL |
[25] |
BOZACK M J, SNIPES E K, FLOWERS G T. Influence of small weight percentages of Bi and systematic coefficient of thermal expansion variations on Sn whiskering[J]. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2017, 7(3):338-344.
doi: 10.1109/TCPMT.2016.2601694 URL |
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