Journal of Shanghai Jiaotong University ›› 2012, Vol. 46 ›› Issue (07): 1159-1162.

• Physics • Previous Articles     Next Articles

Measurement of Cross-plane Thermal Diffusivity of Thin-Films by Thermal Wave Method

 SHEN  Chao, ZENG  Zhi-Gang, SHEN  Bin-Jie, HU  Zhi-Yu   

  1. (Institute of NanoMicro Energy,Shanghai University, Shanghai 200444,China)
  • Received:2011-09-05 Online:2012-07-30 Published:2012-07-30

Abstract: Considering the difficulty of measuring cross-plane thermal diffusivity of thin films, a new method of measuring the cross-plane thermal diffusivity of thin films was approached by combining the apparatus of steady-state comparative-longitudinal heat flow (SCHF) method and the one-dimensional thermal wave in Angstr-m method. The propagation of thermal wave was analyzed and the cross-plane thermal diffusivity of thin films was deduced. By this method, three types of thin films samples (PTFE, polyvinylchloride and polypropylene) with various thicknesses ranging from 30 μm-1 mm were tested and this method is reliable.

Key words: thermal diffusivity, thermal wave, cross-plane, thin-film

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