基于增量式等距映射同双重局部密度方法的工业过程故障检测
冯立伟, 孙立文, 顾欢, 李元

Industrial Process Fault Detection Based on Incremental Isometric Mapping and Double Local Density Method
FENG Liwei, SUN Liwen, GU Huan, LI Yuan
图3 IISOMAP特征空间中样本
Fig.3 Samples in IISOMAP feature space