基于增量式等距映射同双重局部密度方法的工业过程故障检测
Industrial Process Fault Detection Based on Incremental Isometric Mapping and Double Local Density Method
基于增量式等距映射同双重局部密度方法的工业过程故障检测 |
| 冯立伟, 孙立文, 顾欢, 李元 |
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Industrial Process Fault Detection Based on Incremental Isometric Mapping and Double Local Density Method |
| FENG Liwei, SUN Liwen, GU Huan, LI Yuan |
| 图2 中心化后数据散点图 |
| Fig.2 Data scatter plot after centralization |
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