基于增量式等距映射同双重局部密度方法的工业过程故障检测

冯立伟, 孙立文, 顾欢, 李元

Industrial Process Fault Detection Based on Incremental Isometric Mapping and Double Local Density Method

FENG Liwei, SUN Liwen, GU Huan, LI Yuan

表1 TE过程中各方法的故障检测率

Tab.1 Fault detection rate of each method in TE process

组别 KPCA DKPCA WKNN D/% KSFA IISOMAP-DLD T2/% SPE/% T2/% SPE/% T2/% T e 2/% τ/% τe/% f1 98.86 99.14 98.54 99.43 98.86 99.00 98.57 99.14 99.54 f2 94.01 94.86 92.44 94.15 96.57 97.00 94.86 99.00 99.54 f3 0.43 15.55 0.57 1.41 20.86 25.00 52.29 69.00 19.86 f4 99.71 99.71 100 100 99.86 99.86 99.86 100 99.86 f5 0 30.10 0 0.70 37.71 42.00 57.71 73.71 14.71 f6 99.71 99.71 100 100 99.86 99.86 99.86 100 99.86 f7 99.71 99.71 100 100 99.86 99.86 99.86 100 99.86 f8 86.88 89.87 85.84 89.84 88.43 88.71 88.71 90.00 86.00 f9 3.42 17.26 1.57 3.34 22.00 17.71 47.00 62.14 15.57 f10 85.16 89.30 83.12 84.55 88.14 90.86 87.29 90.43 83.00 f11 96.86 98.43 94.13 98.00 97.86 98.14 92.00 98.71 95.29 f12 36.09 80.88 24.75 46.35 70.86 60.57 73.29 79.71 42.57 f13 94.01 95.01 94.28 94.99 94 94.43 93.71 95.57 93.71 f14 98.57 98.72 98.71 98.86 98.71 98.71 91.43 99.00 98.00 f15 0 3.57 0 0 13.29 7.29 58.86 67.14 7.57 f16 1.28 1.28 1.29 1.00 0.86 0.71 0.71 29.86 16.43 f17 83.17 84.88 82.98 84.55 84.71 84.57 82.43 86.86 83.00 f18 49.07 63.62 49.50 58.08 56.86 55.57 59.86 68.86 62.00 f19 91.87 95.72 89.56 94.42 94.57 96.00 94.43 96.71 95.14 f20 84.88 85.16 84.98 85.41 84.29 84.43 81.86 85.14 83.71 f21 1.43 1.28 1.43 1.00 0.71 0.71 1.41 29.29 15.86