基于概率稀疏自注意力的IGBT模块剩余寿命跨工况预测
Remaining Useful Life Prediction of IGBT Modules Across Working Conditions Based on ProbSparse Self-Attention
基于概率稀疏自注意力的IGBT模块剩余寿命跨工况预测 |
| 钟智伟, 王誉翔, 黄亦翔, 肖登宇, 夏鹏程, 刘成良 |
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Remaining Useful Life Prediction of IGBT Modules Across Working Conditions Based on ProbSparse Self-Attention |
| ZHONG Zhiwei, WANG Yuxiang, HUANG Yixiang, XIAO Dengyu, XIA Pengcheng, LIU Chengliang |
| 图8 衰退特征表征能力 |
| Fig.8 Degradation characteristic ability |
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