基于概率稀疏自注意力的IGBT模块剩余寿命跨工况预测
钟智伟, 王誉翔, 黄亦翔, 肖登宇, 夏鹏程, 刘成良

Remaining Useful Life Prediction of IGBT Modules Across Working Conditions Based on ProbSparse Self-Attention
ZHONG Zhiwei, WANG Yuxiang, HUANG Yixiang, XIAO Dengyu, XIA Pengcheng, LIU Chengliang
图6 不同老化循环次数IGBT3的瞬态热阻
Fig.6 Transient thermal resistance of IGBT3 with different aging cycles