基于概率稀疏自注意力的IGBT模块剩余寿命跨工况预测 |
钟智伟, 王誉翔, 黄亦翔, 肖登宇, 夏鹏程, 刘成良 |
Remaining Useful Life Prediction of IGBT Modules Across Working Conditions Based on ProbSparse Self-Attention |
ZHONG Zhiwei, WANG Yuxiang, HUANG Yixiang, XIAO Dengyu, XIA Pengcheng, LIU Chengliang |
图3 加速老化试验台电路原理图 |
Fig.3 Circuit schematic diagram of accelerated aging test bench |