基于概率稀疏自注意力的IGBT模块剩余寿命跨工况预测

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Remaining Useful Life Prediction of IGBT Modules Across Working Conditions Based on ProbSparse Self-Attention

ZHONG Zhiwei, WANG Yuxiang, HUANG Yixiang, XIAO Dengyu, XIA Pengcheng, LIU Chengliang

图2 所提出的模型结构

Fig.2 Proposed model structure