基于概率稀疏自注意力的IGBT模块剩余寿命跨工况预测

钟智伟, 王誉翔, 黄亦翔, 肖登宇, 夏鹏程, 刘成良

Remaining Useful Life Prediction of IGBT Modules Across Working Conditions Based on ProbSparse Self-Attention

ZHONG Zhiwei, WANG Yuxiang, HUANG Yixiang, XIAO Dengyu, XIA Pengcheng, LIU Chengliang

表4 不同模型预测结果

Tab.4 Prediction results of different models

方法 IGBT1→IGBT2 IGBT1→IGBT3 IGBT2→IGBT1 IGBT2→IGBT3 IGBT3→IGBT1 IGBT3→IGBT2 MSE MAE MSE MAE MSE MAE MSE MAE MSE MAE MSE MAE 本文模型 0.001 6 0.031 9 0.001 0 0.024 3 0.002 6 0.041 9 0.001 6 0.033 0 0.005 8 0.058 5 0.001 6 0.032 5 gMLP 0.006 1 0.071 3 0.088 7 0.225 8 0.006 4 0.067 5 0.095 6 0.253 8 0.008 1 0.065 0 0.026 8 0.128 6 LSTM 0.009 3 0.074 3 0.027 3 0.129 4 0.009 2 0.081 7 0.033 1 0.155 7 0.013 5 0.084 5 0.027 6 0.129 4 TCA+gMLP 0.004 2 0.056 6 0.012 7 0.088 9 0.005 5 0.059 1 0.007 5 0.074 0 0.010 0 0.079 1 0.015 5 0.103 2 CORAL+LSTM 0.007 2 0.058 1 0.025 2 0.123 3 0.004 6 0.055 6 0.042 2 0.165 3 0.032 5 0.137 8 0.043 1 0.159 8