连续性RESET/SET对相变存储器疲劳特性的影响 |
吴磊, 蔡道林, 陈一峰, 刘源广, 闫帅, 李阳, 余力, 谢礼, 宋志棠 |
Impact of Continuous RESET/SET Operations on Endurance Characteristic of Phase Change Memory |
WU Lei, CAI Daolin, CHEN Yifeng, LIU Yuanguang, YAN Shuai, LI Yang, YU Li, XIE Li, SONG Zhitang |
图11 连续SET模式下,采用不同RESET-SET次数比得到的PCM单元疲劳特性 |
Fig.11 Endurance characteristics of PCM cells obtained at different RESET-SET ratios in continuous SET mode |