基于可控多扫描使能信号的片上系统TR-TC联合测试成本模型
张金艺a, b, c, 黄徐辉b, 蔡万林b, 翁寒一a, c
TR-TC Associated Test Cost Mathematical Model in SoC Using Controllable Multi-Scan-Enable
ZHANG Jin-Yi-a, b , c , HUANG Xu-Hui-b, CAI Wan-Lin-b, WENG Han-Yi-a, c
上海交通大学学报（自然版）
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2011, (07): 1026
-1030
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